National Instruments PXIe-4137 PXI Source Measure Unit

The NI PXIe-4137 (Part Number: 783761-01) can deliver up to 500 W of instantenous power. Depending on the load and SourceAdapt control settings, pulse widths can be as short as 50 microseconds. These short pulse widths enable tests to finish quickly as well as keep the nearby warming of the gadget under test (DUT) to minimal levels, so the user can perform tests that otherwise may require heat sinks or other thermal control systems. The user can utilize the module's SourceAdapt innovation to custom-tune the PXIe-4137’s reaction to any offered load to accomplish maximum and minimum transients. Removing overshoots helps the DUT while eliminating  oscillations, which is basic for framework stability. Moreover, minimum rise and fall times help guarantee the quickest conceivable test times. This component is especially valuable when managing reactive loads, particularly the capacitance loads in a variety of test applications.

The NI PXIe-4137 SMU mixes high-accuracy source and measure capacity with highlights intended to lessen test time and increment adaptability. These highlights incorporate high channel density for building parallel SMU test frameworks, deterministic hardware sequencing for limiting programming overhead, and high-speed and test rates for rapidly changing setpoints and acquiring data. Moreover, the flexible sampling rate and steaming capability of the PXIe-4137 allows the user to utilize the instrument as a digitizer to catch transient behavior, and the digital control loop enables the user to modify the transient response of the instrument.